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In-situ electron microscopy
TEM in-situ solutions
Spring Series In-Situ Holders
Breeze Series In-Situ Holders
Volcano Series In-Situ Holders
Gravity Series In-Situ Holders
Glacier Series Holders
Accessories Series
Consumable Series
SEM in-situ solutions
Spring Series In-Situ Stages
Breeze Series In-Situ Stages
Volcano Series In-Situ Stages
Gravity Series In-Situ Stages
Glacier Series Stages
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Single-Tilt Tomography Holders
On-Axis Rotation Tomography Holders(Automatic Full Angle)
Multiple Samples Holders(4 Holes)
Air-Free Transfer holders
Double-tilt Holders(GRID)
SEM Vacuum Transfer Chamber
High Vacuum Storage Instrument for Sample Holders
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Porous Silicon Nitride Grid
Porous silicon nitride TEM carrier mesh is based on high-purity monocrystalline silicon and ultra-thin silicon nitride (10-50nm) as the supporting film. It adopts ultra-high temperature coating technology and has the characteristics of low stress corrosion resistance and radiation resistance. It can achieve atomic resolution, especially suitable for atomic resolution characterization under spherical aberration electron microscopy, and is very convenient for transfer analysis between different analytical instruments. Such as TEM, AFM, XRD, EXAFS, Raman, etc.
Static Liquid Cell
The upper and lower chips are formed into a Liquid Cell by bonding the inner seal and epoxy resin outer seal. EDS, EELS, SAED, HRTEM, STEM and other different modes are combined in TEM. The key information such as microstructure evolution, reaction kinetics, phase transition, element valence, chemical change, microscopic stress, and atomic structure and composition evolution at the surface/interface of the sample in the liquid atmosphere can be monitored in real time and even at the atomic level.
Glacier Series Holders(Cryo-Transfer)
With the unique innovative design and processing technology, the telescopic copper mesh carrier and liquid nitrogen freezing transmission module are built in the TEM sample rod,which can realize theHRTEM imaging in the cryogenic environment。
Gravity Series In-Situ Holders(Biasing&Double Tilt)
Gravity Series In-Situ Holders(Biasing&Double Tilt) is used to control the electric field of the sample,combining with EDS,EELS,SAED,HRTEM,STEM and other different modes,The key information such as microstructure evolution,phase transition,elemental valence state,microscopic stress,and surface/interface structure and composition evolution of samples under vacuum environment can be monitored in real time and dynamically at the nano level。
Gravity Series In-Situ Holders(Straining&Single Tilt)
The rod body is made of high strength titanium alloy material to avoid the bending deformation of the rod body during long-term use; The sample rod uses Axis design, built-in high precision reduction gear, stretching step better than 100nm, good straightness of motion. The rectangular opening at the tip of the sample rod has a fastening point at each end, one end is a fixed mounting point, and the other end is a movable cross head, which can securely fix the sample in the corresponding position during the tensile and compression process.
Gravity Series In-Situ Holders(Nano Indentation&Heating&Biasing)
Gravity Series In-Situ Holders(Nano Indentation&Heating&Biasing)applies mechanics, electric field and thermal field to the sample through MEMS chip.The construction of force, electrical, thermal composite multi-field automatic control and feedback in the in-situ sample station Measurement system, combined with EDS, EELS, SAED, HRTEM, STEM and other different modes,realizes real-time and dynamic monitoring of samples in vacuum with temperature, electric field and application at the nano level microstructure evolution, phase transition, elemental valence state, microscopic stress and surface/boundary resulting from afterforce changes Key information such as the structure and composition evolution .
Gravity Series In-Situ Holders(Nano Indentation&Heating)
Gravity Series In-Situ Holders(Nano Indentation&Heating) was constructed by MEMS chip in the in-situ.Mechanical and thermal composite multi-field automatic control and feedback measurement system, combined with EDS, EELS, SAED,HRTEM, STEM and other different modes can realize real-time and dynamic sample monitoring from the nano level Microstructure evolution, phase change and element change with temperature and applied force in vacuum environment Key information such as prime valence states, microscopic stresses, and structural and compositional evolution at the surface/interface.
Gravity Series In-Situ Holders(Nano Indentation&Biasing)
The Gravity Series In-Situ Holders(Nano Indentation&Biasing) was constructed by MEMS chip in the in-situ sample station. Mechanical and thermal composite multi-field automatic control and feedback measurement system, combined with EDS, EELS, SAED,HRTEM, STEM and other different modes can realize real-time and dynamic sample monitoring from the nano level Microstructure evolution, phase change and element change with temperature and applied force in vacuum environment Key information such as prime valence states, microscopic stresses, and structural and compositional evolution at the surface/interface.