TEM in-situ solutions

Product Content

Breeze Series In-Situ Holders(Heating)

By applying thermal field control to the sample through MEMS chips, combined with various modes such as EDS, EELS, SAED, HRTEM, STEM, etc., key information such as microstructure evolution, reaction kinetics, phase transition, element valence, chemical changes, microstresses, and atomic level structure and composition evolution at the surface/interface of the sample can be monitored in real-time and dynamically at the nano or even atomic level in a gas environment.

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Breeze Series In-Situ Holders(Optics&Heating)

A light source introduced through MEMS chips and optical fibers is used to construct a multi field automatic control and feedback measurement system for optical and thermal composite in the in-situ sample stage. By combining various modes such as EDS, EELS, SAED, HRTEM, STEM, etc., real-time and dynamic monitoring of the microstructure evolution, reaction kinetics, phase transition, element valence states, chemical changes of the sample under atmospheric environment with changes in light and thermal fields can be achieved at the nano or even atomic level key information such as microstresses and atomic level structure and composition evolution at the surface/interface.

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Spring Series In-Situ Holders(Heating&Electrochemistry)

Spring Series In Situ Holders (Heating&Electrochemistry) uses MEMS microfabrication technology to construct a liquid atmosphere nanolaboratory in an in-situ sample stage. MEMS chips are used to apply heating fields and electrical signals to thin or nano battery systems, combined with various modes such as EDS, EELS, SAED, HRTEM, STEM, etc., to achieve real-time and dynamic monitoring of key information such as microstructure evolution, reaction kinetics, phase transition, element valence states, chemical changes, microstresses, and atomic level structure and composition evolution of electrodes, electrolytes, and their interfaces in the liquid atmosphere environment at the nanoscale or even atomic level.

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Spring Series In-Situ Holders(Heating)

Using MEMS microfabrication technology to construct a liquid atmosphere nanolaboratory in an in-situ sample stage, the MEMS chip is heated and combined with various modes such as EDS, EELS, SAED, HRTEM, STEM, etc., to achieve real-time and dynamic monitoring of the microstructure evolution, reaction kinetics, phase transition, elemental valence state, chemical changes of the sample in the liquid atmosphere environment with temperature changes at the nano or even atomic level Key information such as microstresses and atomic level structure and composition evolution at the surface/interface.

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Spring Series In-Situ Holders(Electrochemistry)

Using MEMS microfabrication technology to construct a liquid atmosphere nanolaboratory in an in-situ sample holder, electrical signals are applied to thin layers or nano battery systems through MEMS chips. While measuring electrical properties, multiple different modes such as EDS, EELS, SAED, HRTEM, STEM, etc. are combined to achieve real-time and dynamic monitoring of the microstructure evolution, reaction kinetics, phase transition of electrodes, electrolytes, and their interfaces under operating conditions at the nano or even atomic level Key information such as elemental valence states, chemical changes, microstresses, and atomic level structure and compositional evolution at the surface/interface.

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Spring Series In-Situ Holders(Optics)

Using MEMS microfabrication technology to construct a liquid atmosphere nanolaboratory in an in-situ sample holder, light is loaded onto the sample stage as an external field condition through the fiber optic embedded in the sample stage. The sample is stimulated by the light source introduced by the MEMS chip and fiber optic, and various different modes such as EDS, EELS, SAED, HRTEM, STEM are used to measure optical properties simultaneously, achieving real-time measurement from the nano or even atomic level Dynamically monitor key information such as microstructure evolution, reaction kinetics, phase transitions, elemental valence states, chemical changes, microstresses, and atomic level structure and composition evolution at the surface/interface of samples in a liquid atmosphere environment, as a result of changes in the light field.

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Glacier Series Holders(Cryo-Transfer)

With the unique innovative design and processing technology, the telescopic copper mesh carrier and liquid nitrogen freezing transmission module are built in the TEM sample rod,which can realize theHRTEM imaging in the cryogenic environment。

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Gravity Series In-Situ Holders(Nano Indentation&Heating&Biasing)

Gravity Series In-Situ Holders(Nano Indentation&Heating&Biasing)applies mechanics, electric field and thermal field to the sample through MEMS chip.The construction of force, electrical, thermal composite multi-field automatic control and feedback in the in-situ sample station Measurement system, combined with EDS, EELS, SAED, HRTEM, STEM and other different modes,realizes real-time and dynamic monitoring of samples in vacuum with temperature, electric field and application at the nano level microstructure evolution, phase transition, elemental valence state, microscopic stress and surface/boundary resulting from afterforce changes Key information such as the structure and composition evolution .

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Gravity Series In-Situ Holders(Nano Indentation&Heating)

Gravity Series In-Situ Holders(Nano Indentation&Heating) was constructed by MEMS chip in the in-situ.Mechanical and thermal composite multi-field automatic control and feedback measurement system, combined with EDS, EELS, SAED,HRTEM, STEM and other different modes can realize real-time and dynamic sample monitoring from the nano level Microstructure evolution, phase change and element change with temperature and applied force in vacuum environment Key information such as prime valence states, microscopic stresses, and structural and compositional evolution at the surface/interface.

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Gravity Series In-Situ Holders(Nano Indentation&Biasing)

The Gravity Series In-Situ Holders(Nano Indentation&Biasing) was constructed by MEMS chip in the in-situ sample station. Mechanical and thermal composite multi-field automatic control and feedback measurement system, combined with EDS, EELS, SAED,HRTEM, STEM and other different modes can realize real-time and dynamic sample monitoring from the nano level Microstructure evolution, phase change and element change with temperature and applied force in vacuum environment Key information such as prime valence states, microscopic stresses, and structural and compositional evolution at the surface/interface.

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