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Volcano Series In-Situ Holders (Optics&Heating&Double Tilt)

Volcano Series In-Situ Holders (Optics&Heating&Double Tilt)

Volcano Series In Situ Holders (Optics&Heating&Double Tilt) construct an optical and biasing composite multi field automatic control and feedback measurement system in an in-situ sample stage using a light source introduced by optical fibers and MEMS chips. By combining multiple different modes such as EDS, EELS, SAED, HRTEM, STEM, etc., real-time and dynamic monitoring of the microstructure evolution, phase transition, and elemental valence states of the sample under vacuum environment with changes in light field and temperature can be achieved at the nanoscale or even atomic level Key information such as microstresses and atomic level structure and composition evolution at the surface/interface.

Volcano Series In-Situ Holders (Heating&Biasing&Double Tilt)

Volcano Series In-Situ Holders (Heating&Biasing&Double Tilt)

Volcano Series In-Situ Holders (Heating&Biasing&Double Tilt) constructs a thermal and electrical composite multi field automatic control and feedback measurement system using MEMS chips in an in-situ sample stage, combined with various modes such as EDS, EELS, SAED, HRTEM, STEM, etc.,key information such as microstructure, phase transition, element valence state, microstress, and atomic level structure and composition evolution at the surface/interface of the sample can be monitored in real-time and dynamically at the nano or even atomic level under vacuum environment.

Double-tilt Holders(Copper Mesh)

Double-tilt Holders(Copper Mesh)

CHIPNOVA Double-tilt Holders' new structural design and ultra-precision tilt control enable high-resolution imaging observation of crystal microstructure and chemical states at different angles.

Gravity Series In-Situ Stages(Nano Indentation&Heating)

Gravity Series In-Situ Stages(Nano Indentation&Heating)

The force and thermal composite multi-field automatic control and feedback measurement system is constructed in the in-situ sample station by MEMS chip, combined with EDS, EBSD and other different modes. The key information such as microstructure evolution, phase transition, elemental valence state, microscopic stress, and surface/interface structure and composition evolution of samples under vacuum environment can be monitored in real time and dynamically at the nano level.

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